This one week Mixed Signal Test Methods course provides comprehensive training on the essential concepts of Mixed Signal Test. This information rich course is designed to elevate the baseline understanding and capabilities of product/test engineers, sales engineers and their managers.

Beginning with basic concepts and terminology, the seminar progresses to provide knowledge and understanding of the more complex elements of Mixed Signal Technology. This class introduces digital test and linear test engineers to the mixed signal world by teaching the basics of analog and mixed signal test methods. Sampling Theory, Frequency Domain Testing, and Digital Signal Processing are discussed in detail. The course applies these fundamental concepts to different test methods and data validation for mixed signal parameters together with debugging, noise reduction and device interface techniques. Actual application examples are illustrated showing how mixed signal ATE systems implement the tests.

Test Technologists Team personnel have been developing and presenting technical training and test solutions to the engineering community worldwide since 1978. Course material and training procedures focus on a quality learning experience, which is intuitive, incremental, and interactive.

Goals

• Understand the classification of mixed signal devices.
• Understand the requirements of a mixed signal tester.

Objectives - Qualify the student to:

• State the definition of mixed signal technology.

• Provide examples of mixed signal device types.

• List the required capability of a mixed signal tester.

• Real World Signals
• Binary Signals and Analog Signals
• Digitized Analog
• What is Mixed Signal?
• Mixed Signal Sampler
• Test System Overview
• Signal Source
• Signal Capture
• Signal Analysis
• Knowledge Check

Goals

• Review the basic concepts of analog circuit design.
• Understand the diversity of analog circuit capability.

Objectives - Qualify the student to:

• State the basic laws of analog circuit design.
• Provide examples of analog circuit blocks 

Section Outline:

• Ohm, Kirchoff, Lenz, and Murphy
• Operational Amplifiers

• Filters - Passive and Active
• Special Amplifiers

Instrumentation Amps

• Buffers, Line Drivers and Line Receivers
• Complex Analog Blocks

• Converters

• Knowledge Check

Goals

• Understand the essential concepts of Sampling Theory as it pertains to sourcing Mixed Signal data

Objectives - Qualify the student to:

• State the relationship between sample frequency and sample size
• Describe the nature and importance of a periodic sample set.

Section Outline:

• ATE System Signal Generator Circuits  
• Periodic Sample Sets

• Sourcing Mixed Signal Data
• The Sine Wave Equation - Applying an Equation
• Sample Size and Sample Frequency
• Multi-Tone Signals
• DSP’s Law
• Samples per Cycle
• Sine (X) over X
• Frequency Resolution in the Frequency Domain
• Knowledge Check

Goals

• Understand the essential concepts of Sampling Theory as it pertains to capturing Mixed Signal data.

Objectives - Qualify the student to:

• State the relationship between sample frequency and sample size pertaining to digitizer parameters.
• Describe the limitations and constraints of signal digitizing.

Section Outline: 

• ATE System Digitizer Circuits
• Quantizing Error

• Sample Size and Sample Rate

• Signal Averaging
• Oversampling
• Time Domain Test Parameters
• Frequency Domain Test Parameters
• Harmonic Distortion Testing
• Signal to Noise Testing
• Knowledge Check

Goals

• Understand the essential concepts of frequency domain analysis
• Understand the requirements of the 'FFT' algorithm.
• Understand frequency domain measurements.

Objectives - Qualify the student to:

• Describe the relationship between time domain and frequency domain data.
• Describe the effects of time windows (Hanning, Blackman, etc.) on the frequency domain signal data.

Section Outline:

• Time Domain and Frequency Domain

• Fourier Analysis and the Fast Fourier Transform (FFT)
• Convolution
• Interpreting Frequency Domain Data

• Brick Wall Filters
• Mathematical Oversampling
• Frequency Domain Constraints and Solutions
• Knowledge Check

Goals

• Understand the essential concepts of Digital Signal Processing techniques as applied to Mixed Signal test.

Objectives - Qualify the student to:

• State the functional distinctions of a Digital Signal Processor.
• Describe the various classes of DSP algorithms.
• List the steps of DSP algorithms required to perform an FFT and extract the 'Signal to Noise Ratio' (SNR).

Section Outline:

• DSP Algorithms

• Signal Analysis Algorithms

• Application Examples:

• Knowledge Check

Goals

• Understand the requirements for testing DC and AC parameters of Digital to Analog Converters

Objectives - Qualify the student to:

• State the definitions of Differential Non-Linearity (DNL) and Integral Non-Linearity (INL).
• Describe the techniques for testing INL and DNL.
• Describe the techniques for testing converter harmonic distortion and Signal to Noise Ratio.
• Describe the techniques for testing AC characteristics such as Glitch Impulse Area.

Section Outline:

• DC Tests

• AC Tests

• Knowledge Check

Goals

• Understand the requirements for testing DC and AC parameters of Analog to Digital Converters

Objectives - Qualify the student to:

• Describe the techniques for testing INL and DNL.
• Describe the techniques for testing converter harmonic distortion and Signal to Noise Ratio.
• Describe the techniques for testing AC characteristics such Aperture Delay.

Section Outline:

• Comparing ADC to DAC testing

• DC Tests

• AC Tests

• Knowledge Check

Goals

• Understand the requirements for testing Modem, Codec, and Phase Locked Loop (PLL) devices.

Objectives - Qualify the student to:

• Describe the modem process for bit packing, error correction and data compression.
• Outline the codec implementation of dynamic range compression.
• State the function of each block in a PLL.
• Describe test techniques for testing jitter.

Section Outline:

• Modem Technology

• Codec Technology
• T1 and E1
• Codec Test Requirements

• Phase Lock Loop

• Knowledge Check

Understand the requirements for Mixed Signal test circuit design.

Qualify the student to:

• Describe the cause and effects of shared ground returns.
• State the parasitic effects of conductors and passive components.
• Describe the constraints of circuit board layout.

Section Outline:

• Signal Routing

• Parasitic Effects of Passive Components
• Grounding and Signal routing

• Power Distribution
• Sockets, Probers and Handlers
• Knowledge Check